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Defeitos superficiais em 2H-WS2 observados por microscopia de tunelamento Surface defects on 2H-WS2 detected by scanning tunnelling microscopy

机译：隧道显微镜观察2H-WS2的表面缺陷扫描隧道显微镜观察2H-WS2的表面缺陷

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F. Wypych; Th. Weber; R. Prins;
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年度 1998
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1. Defeitos superficiais em 2H-WS2 observados por microscopia de tunelamento [J] . R. Prins, Th. Weber Química Nova . 1998,第1期

机译：隧道显微镜观察2H-WS2中的表面缺陷
2. Surface defects on 2H-WS2 detected by scanning tunnelling microscopy [J] . Eidgen?ssische Technische Hochschule Zürich, Prins R., Universidade Federal do Paraná Curitiba, Quimica nova . 1998,第1期

机译：扫描隧道显微镜检测2H-WS2的表面缺陷
3. Enhancing the electrocatalytic activity of 2H-WS2 for hydrogen evolution via defect engineering [J] . Wu Longfei, van Hoof Arno J. F., Dzade Nelson Y., Physical chemistry chemical physics: PCCP . 2019,第11期

机译：通过缺陷工程增强2H-WS2的电催化活性
4. Intrinsic point defects on a TiO_2(110) surface and their reaction with oxygen: a scanning tunneling microscopy study [C] . Markus Kuhn, J.F.Anderson, Jeremy Lehman, Symposium on Epitaxial Oxide Thin Films III March 31-April 2, 1997, San Francisco, California,U.S.A . 1997

机译：TiO_2（110）表面的本征点缺陷及其与氧的反应：扫描隧道显微镜研究
5. Scanning tunneling microscopy studies of growth medium & temperature dependent structural phases of alkanethiol self-assembled monolayers, reactive self-assembled monolayers, & flat gold nanoparticle/indium tin oxide substrates and a scanning surface photovoltage microscopy study for local mechanical stress characterization in complementary metal oxide semiconductor devices. [D] . Dahanayaka, Dahanayaka Liyanage Daminda Hemal. 2010

机译：烷烃硫醇自组装单分子层，反应性自组装单分子层，扁平金纳米颗粒/铟锡氧化物基质的生长介质和温度依赖性结构相的扫描隧道显微镜研究，以及互补金属氧化物中局部机械应力表征的扫描表面光电压显微镜研究半导体器件。
6. Defects in oxide surfaces studied by atomic force and scanning tunneling microscopy [O] . Thomas König, Georg H Simon, Lars Heinke, 2015

机译：通过原子力和扫描隧道显微镜研究氧化物表面的缺陷
7. Defeitos superficiais em 2H-WS2 observados por microscopia de tunelamento Surface defects on 2H-WS2 detected by scanning tunnelling microscopy [O] . F. Wypych, Th. Weber, R. Prins 1998

机译：Defeitos superficiais em 2H-Ws2 observados por microscopia de tunelamento扫描隧道显微镜检测2H-Ws2表面缺陷
8. Surface Topography of Pyrolitic Carbons and of Au Thin Films by Scanning Tunneling Microscopy: Grain Boundaries and Surface Defects [R] . Salmeron, M. , Marchon, B. , Ferrer, S. , 1987

机译：通过扫描隧道显微镜观察火成碳和au薄膜的表面形貌：晶界和表面缺陷

Defeitos superficiais em 2H-WS2 observados por microscopia de tunelamento Surface defects on 2H-WS2 detected by scanning tunnelling microscopy

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